| No. |
Presentation Time |
Presentation Title |
Speaker |
Abstract |
| WS1-1 |
09:00-09:40 |
Robot-based Antenna Measurement System for Future Communication |
Jae-Yong Kwon (KRISS, Korea) |
Abstract
A multi-functional 7-axis antenna measurement system has been implemented using robots for field measurements. We achieved a high level of positional precision, resulting in repeatable and accurate measurement results, even in the sub -THz band, which extends up to 500 GHz. We are developing a robot-based field measurement for sub-THz antennas and AiPs (Antenna in Package) for future comm applications. The system and measurement results will be presented for open discussions.
|
| WS1-2 |
09:40-10:20 |
Advances in mm-wave Optoelectronic Measurements |
Navneet Kataria
(Anritsu, USA) |
Abstract
The increasing direct RF bandwidth needs for optoelectronic links for data centers and other applications has led to increased attention on mm-wave optical converter (OE-EO) measurements. This talk will cover some of the changing uncertainty contributions above 140 GHz RF bandwidth and possible method modifications.
|
| WS1-3 |
10:20-11:00 |
Field-calibrated Electro-optic Probe for Millimeter Wave Measurement |
Dong-Joon Lee
(KRISS, Korea) |
Abstract
We present a technique for measuring millimeter-wave electromagnetic fields using a miniature fiber-coupled field probe, constructed from electro-optic (EO) crystal-based dielectric material. This method ensures minimal distortion of the electromagnetic waves during the measurement process. A WR-28 waveguide, transmitting Ka-band electromagnetic waves, is utilized to generate an absolute electric field that can be analytically computed. The miniature EO probe is positioned along the propagation direction of the electromagnetic waves at the waveguide's aperture, enabling endoscopic measurements of the electric field within the waveguide. Additionally, the method includes the measurement of standing waves within the waveguide, induced by reflected waves at the aperture. This approach offers an innovative technique for evaluating the waveguide’s transmission characteristics in terms of the V/m absolute electric field.
|
| WS1-4 |
11:00-11:30 |
Enabling 6G: Sub-THz Measurement Innovations for Component and System Development |
Suren Singh
(Keysight, USA) |
Abstract
This session explores advanced measurement techniques at sub-terahertz (sub-THz) frequencies to support the development of 6G components and systems. Key topics include wideband performance characterization and the implementation of next-generation single-sweep solutions utilizing the 0.5 mm connector. Additionally, the session highlights the role of spectrum analyzers in evaluating over-the-air (OTA) system-level characteristics, offering insights into practical applications and measurement strategies for emerging 6G technologies.
|
| WS1-5 |
11:30-12:00 |
Metrology Advances For Sub-THz Development |
Suren Singh
(Keysight, USA) |
Abstract
In this paper, we examine the fundamental aspects of traceability that underpin measurements in the sub-THz range. We provide an overview of the research and implementation of new standards at National Metrology Institutes (NMIs), which serve as the primary sources of traceability. Additionally, we discuss the measurement products that facilitate the implementation of sub-THz test systems. Calibration and performance verification are crucial for the reliable operation of test systems in the sub-THz range. We explore various methodologies for implementing these processes, ensuring that the systems deliver accurate and consistent results. Our findings include measurement results and simplified uncertainty calculations, offering insights into the achievable performance levels.
|
| - |
12:00-13:00 |
Lunch |
| WS1-6 |
13:00-13:40 |
Development and Characterization of Electronic Based Noise Sources to 750 GHz |
Tom Crowe (Virginia Diode Inc., USA) |
Abstract
Noise sources are a key technology for the characterization and calibration of THz instrumentation ranging from amplifiers to radiometers. This talk will describe the development of noise sources, both diode and transistor based, with a focus on increasing ENR (excess noise ratio) to enable a wide range of applications. In addition, the characterization methods and error analysis of the noise sources will be presented.
|
| WS1-7 |
13:40-14:10 |
Establishing Traceability for the 0.8 mm Coaxial Connector |
Frauke Gellersen (PTB, Germany) |
Abstract
This presentation explains in detail how traceability for the 0.8 mm coaxial connector is established at PTB. It covers SI-traceable calibration for coaxial measurements up to 167 GHz, using seven calculable offset short standards within the 0.8 mm coaxial system. The talk will present accurate dimensional measurements, from which the S-parameters of the standards are analytically calculated. In the primary experiment, an over-determined calibration approach is used, treating material and surface properties as optimization parameters. The standards, derived from dimensional data, serve as input for an over-determined least-squares calibration. Measurement results of both the primary and the transfer experiment, as well as associated uncertainty budgets are presented and discussed for selected representative calibration standards. Additionally, the main contributors to the overall uncertainty will be analyzed. The repeatability of the connector interface and the influence of a minimal pin gap are investigated, and challenges are discussed. This provides the audience with valuable insight and a deeper understanding of the sources of measurement uncertainty in high-frequency coaxial calibrations.
|
| WS1-8 |
14:10-14:50 |
Simulation Assisted S-parameter Measurements for 6G Components |
Kooho Jung (MPI Corporation, USA) |
Abstract
Accurate S-parameter measurements for 6G components can be challenging due to using broader and higher frequencies. To overcome this challenge, 3D electromagnetics simulations as well as lumped circuit simulations may be used to enhance the measurement’s accuracy. Examples will be presented for open discussions on their validities and possible improvements.
|
| WS1-9 |
14:50-15:30 |
Large-Signal Characterization Techniques for 6G Applications |
Osman Ceylan (Maury Microwave, USA) |
Abstract
Advances in semiconductor technologies are driving optimized and well-performing integrated system designs for 6G. Meeting the broadband, high data rate, and complex modulation demands of 6G require accurate, reliable, wideband modeling and characterization of the active components at 6G frequencies, such as sub-THz frequencies. This presentation will highlight the latest large signal characterization and measurement techniques, including automated electromechanical impedance tuner based passive setups and active/hybrid load-pull methods up to 1.1 THz. The performance expectations of these setups and the unique challenges associated with large-signal measurements will also be discussed.
|
| - |
15:30-15:45 |
Coffee Break |
| WS1-10 |
15:45-16:25 |
Methods for Improving Confidence in Wafer-Level Calibration and Characterization at mmW frequencies. |
Andrej Rumiantsev (MPI Corporation, USA) |
Abstract
Ensuring confidence in wafer-level mm-wave measurements requires rigorous calibration methodologies, robust validation strategies, and careful control of influencing factors. This presentation reviews practical methods for increasing trust in both calibration and characterization processes at mm-wave frequencies. Key topics include quantifying and reducing uncertainty, improving data repeatability, validating calibration procedures, and mitigating environmental and setup-induced variations. Real-world examples will illustrate how these recommended methods contribute to higher data integrity and reproducibility at the wafer level in the mm-wave range
|
| WS1-11 |
16:25-17:05 |
RF Power Measurements |
Karsten Kuhlmann (PTB, Germany) |
Abstract
This overview presentation will be organized into three parts. Part I will briefly repeat the fundamentals of RF power calibrations traceable to SI, and examples for RF microcalorimeter realizations up to 220 GHz will be shown. Part II will explain how the quantity RF power is disseminated using suitable transfer standards as well as different commercial sensors and receiver systems. In part III different methods of accurate RF power measurements of signal sources will be presented and discussed. In an open discussion the audience will have the chance to ask questions from the complete field of RF power.
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